Gallium Arsenide Phosphide Schottky Barrier Field Effect Transistor
Fabrication processes have been developed for gallium arsenide phosphide Schottky‐barrier field effect transistor (SBFET) on an insulating gallium arsenide substrate. Process techniques as well as results of electrical characterization of the device structure including the
interface are described. Formation of a conductive layer near the
interface is postulated, and an anlaysis of its effects on transistor characteristics is presented.
Source:IOPscience
没有评论:
发表评论